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INSPECT400 Measuring Metallurgical Microscope for Wafer inspect

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Leader Precision Instrument Co., Ltd
City:dongguan
Province/State:guangdong
Country/Region:china
Contact Person:MrDavid
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INSPECT400 Measuring Metallurgical Microscope for Wafer inspect

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Supply Ability :50, 000PCS/Year
Payment Terms :L/C, T/T, Western Union, MoneyGram
Place of Origin :China
Price :negotiation
MOQ :1 Piece
Brand Name :MICRO ACCURACY
Model Number :INSPECT400
Certification :CE
Delivery Time :14 WORKNG DAYS
Model NO. :INSPECT400
Accuracy :(2.5+L/150)Micron
Z axis Driving System :Servo Motor Control
Resolution of X/Y/Z-Axis :0.001 mm
Software :ZoomView
Eyepiece Magnification :50*500X
Trademark :Micro Accuracy
Transport Package :Standard Exporting Package
Specification :SGS, CE
Origin :Guangdong
HS Code :9031809090
Port :Shenzhen, China
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INSPECT400 Measuring Metallurgical Microscope for Wafer inspect

Usage

INSPECT series measuring metallurgical microscope are widely used in semiconductor packages, solder pads, loop height, FPD panels (LCM), wafer level CSPS and so on.

Features

■ High-precision marble base, table and column to ensure high stability and rigidity

■ Marble table design, with precision V-shaped cross rail, ensure long-term use without deform, effectively guarantee high mechanical precision

■ High-quality optical system and high-resolution CCD ensure sharp image edges

■ Three-ring and eight-zone LED ring surface cold light source and contour light source, avoid the deformation of precision parts caused by the heat from light

■ Optional Nikon tilting trinocular tube + quintuple nosepiece

■ Independent research and development of image measuring software, powerful and easy to operate

Technical data

Model INSPECT300 INSPECT400 INSPECT500
X,Y axis travel(mm) 300*200 400*300 500*400
Stage glass size(mm) 357*257 457*357 557*457
Z axis travel(mm) 100
X,Y,Z axis resolution (μm) 1
Length unit Linear scale
Measuring accuracy (μm) 2.5+L/150, L=measuring length (mm)
Operation mode(X, Y) Manual
Operation mode(Z) CNC
Camera High resolution CCD camera
Quintuple nosepiece 5X 10X 20X 50X
Eyepiece WF10X
Measuring software 2D measuring software
Illumination Transmitted Epi-illumination system
Contour LED parallel contour light
Power supply AC100~240V 50/60Hz

Features of Infinity plan achromatic bright field objective

PL L5X/0.12 (Work distance):26.1 mm
PL L10X/0.25 (Work distance):20.2 mm
PL L20X/0.40 (Work distance):8.80 mm
PL L50X/0.70 (Work distance):3.68 mm

6V/30W halogen and brightness enable control( Reflected light)
INSPECT400 Measuring Metallurgical Microscope for Wafer inspect

INSPECT400 Measuring Metallurgical Microscope for Wafer inspect

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